Near-Field IR Orientational Spectroscopy of Silk

Near-Field IR Orientational Spectroscopy of Silk

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Orientational dependence of the IR absorbing amide bands of silk is demonstrated from two orthogonal longitudinal and transverse microtome slices with a thickness of only ∼100 nm.Scanning near-field optical microscopy (SNOM) which preferentially probes orientation perpendicular to the sample’s surface was used.Spatial resolution rico reserve clarinet mouthpiece of the silk−epoxy boundary was ∼100 nm resolution, while the spectra were collected by a ∼10 nm tip.Ratio of the absorbance of the amide-II C-N at 1512 cm − 1 and amide-I C=O β -sheets at 1628 cm − 1 showed sensitivity of SNOM to the molecular orientation.SNOM characterisation is complimentary to the far-field 2334-080 absorbance which is sensitive to the in-plane polarisation.

Volumes with cross sections smaller than 100 nm can be characterised for molecular orientation.A method of absorbance measurements at four angles of the slice cut orientation, which is equivalent to the four polarisation angles absorbance measurement, is proposed.